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Measuring Up: Laser Scanning Software Tools

In the future, eMicroscribe plans to update their software line, and an upgrade will be released for SDK in fourth quarter 2008, which will include the ability to run multiple instances on a single computer and take measurements in parallel.

Also, eMicroscribe is planning to release Mus 2.0 in 2009. The new version is expected to include a graphical user interface.

John Myers is a journalism graduate from the University of New Mexico and the editor for CATIA community and SolidWorks community.

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Published 2008-12-03 21:57:03 
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